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Front-End

  • Wafer based micro-lens processing
  • Batch production (tip. 12 wafers at a time)
  • Wafer based metrology & inspection
MOE Resist Coating

Resist Coating

MOE Mask Exposition

Mask Exposition

MOE Resist Development

Resist Development

MOE Thermal Reflow And Lens Measurement

Thermal Reflow & Lens Measurement

MOE Transfer Into Base Material

Transfer into Base Material (Etching)

MOE Lens Measurement

Lens Measurement

Item added to watchlist